CPUStress Tests (Device Fundamentals)

The CpuStress tests perform device I/O testing with different processor utilization levels.

CpuStress

Test	Description
Device I/O with alternating processor utilization levels	This test does device I/O testing while alternating between high (HPU) and low (LPU) processor utilization levels. Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc Test method: Device_IO_With_Varying_ProcUtil Parameters: - see Device Fundamentals Test Parameters DQ PingPongPeriod HPU LPU TestCycles
Device I/O with a fixed processor utilization level	This test does device I/O testing with the processor utilization (PU) level set to a fixed percentage. Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc Test method: Device_IO_With_Fixed_ProcUtil Parameters: - see Device Fundamentals Test Parameters DQ IOPeriod PU
Device PNP with a fixed processor utilization level	This test does device PNP testing with the processor utilization (PU) level set to a fixed percentage. Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc Test method: Device_PNP_With_Fixed_ProcUtil Parameters: - see Device Fundamentals Test Parameters DQ TestCycles PU
Sleep with fixed processor utilization	This test cycles the system through various sleep states with the processor utilization level set to a fixed percentage. Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc Test method: Sleep_With_Fixed_ProcUtil Parameters: - see Device Fundamentals Test Parameters TestCycles PU