Storage Block Device Driver API Test for Hard Drive (Compact 2013)

3/26/2014

The Storage Device Block Driver Application Programming Interface (API) Test assesses the functionality of mass storage block drivers. It includes test cases that verify that a block driver is working correctly so that you can mount a file system on the disk. The test also examines whether a block driver can read from and write to a disk, verifies data located on that disk, and then tests all disk boundary conditions. To work correctly, a mass storage block driver is not required to pass all test cases in the Storage Device Block Driver API Test.

The hard drive storage devices include any commercially available device that is able to connect over IDE and (S)ATA.

Your device must meet the following requirements before you run this test.

The following table shows the hardware requirements for the Storage Device Block Driver API Test.

Requirements

Description

A mass storage device

A hard drive that has an IDE or (S)ATA interface.

The following table shows the software requirements for the Storage Device Block Driver API Test.

Requirements

Description

Tux.exe

Tux test harness, required for test execution

Kato.dll

Kato logging engine, required for logging test data

Disktest.dll

Library containing the test

Mass storage block driver

In the OS design, you must include a mass storage block driver that supports the mass storage device

The table below lists the subtests included in this test.

SubTest ID

Description

4002

Format mass storage disk.

Tests the functionality of the IOCTL_DISK_FORMAT_MEDIA IOCTL. If the disk supports only previous IOCTLs, use the /oldioctls command-line parameter to test the DISK_IOCTL_FORMAT_MEDIA IOCTL instead.

This test case fails if the block driver does not support the IOCTL. If the storage device does not require or support low-level formatting, the driver should immediately report success.

4003

Write, Read, Verify 1 sector at a time.

Verifies that data written one sector at a time to any sector of the disk can be read back correctly.

This test case fails if data is corrupted while reading or writing. It also fails if the boundary of a read or write buffer is overwritten.

4004

Write, Read, Verify 8 sectors at a time.

Verifies that data written eight sectors at a time to any sector of the disk can be read back correctly.

This test case fails if data is corrupted while reading or writing. It also fails if the boundary of a read or write buffer is overwritten.

4005

Write, Read, Verify 32 sectors at a time.

Verifies that data written 32 sectors at a time to any sector of the disk can be read back correctly.

This test case fails if data is corrupted while reading or writing. It also fails if the boundary of a read or write buffer is overwritten or if the storage device does not support large reads or writes.

4006

Write, Read, Verify 256 sectors at a time.

Verifies that data written 256 sectors at a time to any sector of the disk can be read back correctly.

This test case fails if data is corrupted while reading or writing. It also fails if the boundary of a read or write buffer is overwritten or if the storage device does not support large reads or writes.

4007

Write, Read, Verify 65536 sectors at a time.

Verifies that data written 65536 sectors at a time to any sector of the disk can be read back correctly.

This test case fails if data is corrupted while reading or writing. It also fails if the boundary of a read or write buffer is overwritten or if the storage device does not support large reads or writes.

4008

Write, Read, Verify increasing buffer sizes.

Reads and writes onto the sectors in increasing buffer sizes. Also compares the read and written data on each sector buffer size.

4009

Write, read multi-SG 2 sectors at a time.

Verifies that reading scatter-gather (SG) buffers two sectors at a time behaves correctly.

This test case fails if the driver for the storage device does not support reading multiple SG buffers. It also fails if data is corrupted while reading or writing or if the boundary of a read or write buffer is overwritten.

4010

Write, read multi-SG 8 sectors at a time.

Verifies that reading SG buffers eight sectors at a time behaves correctly.

This test fails if the driver for the storage device does not support reading multiple SG buffers. It also fails if data is corrupted while reading or writing or if the boundary of a read or write buffer is overwritten.

4011

Write, read multi-SG 32 sectors at a time.

Verifies that reading SG buffers 32 sectors at a time behaves correctly.

This test fails if the driver for the storage device does not support reading multiple SG buffers. It also fails if data is corrupted while reading or writing or if the boundary of a read or write buffer is overwritten.

4012

Write, read multi-SG 256 sectors at a time.

Verifies that reading SG buffers 256 sectors at a time behaves correctly.

This test fails if the driver for the storage device does not support reading multiple SG buffers. It also fails if data is corrupted while reading or writing or if the boundary of a read or write buffer is overwritten.

4013

Write, read multi-SG 65536 sectors at a time.

Verifies that reading SG buffers 65536 sectors at a time behaves correctly.

This test fails if the driver for the storage device does not support reading multiple SG buffers. It also fails if data is corrupted while reading or writing or if the boundary of a read or write buffer is overwritten.

4014

Write using 2-8 SG buffers, read + verify.

Verifies that writing to multiple SG buffers behaves correctly. First, this test case writes data to between 2 and 8 SG buffers of random size. Then, it reads back the same range of sectors by using a single SG buffer and compares the data read to the data written.

This test case fails if the driver for the storage device does not support multiple SG buffer writes. It also fails if the driver requires individual SG buffers to be sector aligned or if data is corrupted while reading or writing.

4015

Write, read using 2-8 SG buffers + verify.

Verifies that reading multiple SG buffers behaves correctly. First, this test case writes data by using a single SG buffer. Then, it reads data by using between 2 and 8 SG buffers of random size and compares the data written to the data read.

This test case fails if the driver for the storage device does not support reading multiple SG buffers. It also fails if the driver requires individual SG buffers to be sector aligned or if data is corrupted while reading or writing.

4016

Read and write with 2 SG buffers, varying size.

Verifies that SG buffers of any size work correctly. This test case fails if the driver for the storage device does not support multiple SG buffer reads or writes. It also fails if the driver requires individual SG buffers to be sector aligned.

4017

Read buffer extends past last sector.

Verifies the behavior of reading from a disk when the request extends past the last sector on the disk.

This test case fails if reading succeeds. A failure of the test case does not necessarily indicate a problem with the driver.

4018

Read starts past final sector.

Verifies the behavior of reading from a disk when the request starts past the last sector on the disk.

This test case fails if reading succeeds. A failure of the test case does not necessarily indicate a problem with the driver.

4019

Write buffer extends past last sector.

Verifies the behavior of writing to a disk when the request extends past the last sector on the disk.

This test case fails if writing succeeds. A failure of the test case does not necessarily indicate a problem with the driver.

4020

Write starts past final sector.

Verifies the behavior of writing to a disk when the request starts past the last sector on the disk.

This test case fails if writing succeeds. A failure of the test case does not necessarily indicate a problem with the driver.

4021

Delete sector test cases.

Verifies the functionality of the IOCTL_DISK_DELETE_SECTORS IOCTL when it is given parameters that are not valid.

It is not required that a driver support this IOCTL. If the driver does not support this IOCTL, the test case is skipped.

This test case fails if the IOCTL_DISK_DELETE_SECTORS IOCTL does not handle bounds cases correctly.

4022

Write using various buffer types.

Verifies the ability of the driver to write from the following types of buffers:

* Heap allocated

* Stack allocated

* Read only

* DWORD aligned

* Word aligned

* Byte aligned.

This test case fails if the driver cannot read from one of the buffer types or if the driver does not appropriately handle unaligned buffers when aligned buffers are required, for example with direct memory access (DMA) transfer.

4023

Read using various buffer types.

Verifies the ability of the driver to read into the following types of buffers:

* Heap allocated

* Stack allocated

* DWORD aligned

* Word aligned

* Byte aligned.

This test case fails if the driver cannot read into one of the buffer types or if the driver does not appropriately handle unaligned buffers when aligned buffers are required, for example with DMA transfer.

4024

Write, Read single invalid buffer.

Verifies by writing and reading data from invalid and NULL buffers. This test is expected to fail when writing or reading.

4025

Write, Read multi-SG sectors with exceed # SG.

Verifies by writing out of the boundary size of the buffer. This test is expected to fail when written out the buffer size.

4026

Write, Read multi-SG invalid sectors.

Verifies by writing or reading from a NULL buffer. This test is expected to fail.

4027

Write, Read test with invalid Ioctl.

Reads or writes into the buffer with size 0.

The Windows Embedded Compact platform under test must have a formatted IDE or (S)ATA hard drive attached and mounted.

The storage device can be formatted using a Windows-based desktop machine's built-in formatting application. This assumes the use of one partition.

COMMAND LINE PARAMETERS:

You can modify the test by editing the command line. To specify one or more of the following optional command line parameters for this test, use the -c command line parameter, which forces Tux to pass the specified string into the test module. If your hard drive storage device uses a different storage profile name other than "HDProfile", please use that name in the command line.

SYNTAX:

tux -o -d disktest -c "-zorch [-disk DSKX:] [-profile <profile>] [-oldioctls] [-sectors <count>] [-store]"

Command Line Parameters

Description

-disk DSKx:

Specifies the device name of the disk to be tested. If you do not specify this parameter, the test probes for a mass storage disk on devices DSK1-DSK9. Specifying this parameter overrides the automatic detection process and forces the test to use the disk that you specify.

-profile <profile>

Specifies the storage profile and limits testing to the devices with the specified storage profile. The default storage profile is "all profiles".

-oldioctls

Forces the test to use the previous disk I/O control codes (IOCTLs) instead of the current set of IOCTLs. The previous IOCTLs are prefixed with "DISK_IOCTL_" and are not Windows Embedded CE IOCTLs. The current set of IOCTLs are prefixed with "IOCTL_DISK_". Many block drivers support both previous and current IOCTLs. You can use this parameter to verify that current and previous IOCTLs work correctly.

-sectors <count>

Sets the maximum number of sectors per read/write transaction. You can use this parameter for a storage device to set the physical limit on the number of sectors that are transferred by the storage device at one time. The default value is 128 sectors.

-store

Specifies that the test opens a handle to the disk by using the OpenStore function instead of the CreateFile function. Notice that you are not required to open a handle by using OpenStore to test block driver functionality. However, it is useful for testing a storage device that Filesys.exe loads automatically if you cannot open the storage device. For example, you can open a handle to a flash driver for ROM by using the OpenStore function.

-zorch

Enables the functionality of the test. Without this parameter, the test will fail. With this parameter, the test will run and destroy all data on the storage device.

Note:

During the test, all information on the storage device is destroyed. The test writes to and reads from sectors on the storage device without preserving the contents of the sectors. Microsoft recommends that you back up data on all cards and disks that are attached to the tested device before running the test.

When the test completes running, verify that "PASS" appears in the test log for all sub-tests.

* The hard drive devices on Windows Embedded Compact device typically use the HDProfile profile. If your device uses a different profile name, you can specify that in the command line. Alternatively, you can provide the device name of the file system via the "disk" option.

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