Device-Independent Bitmap Test Module (Windows Embedded CE 6.0)
1/6/2010
The device-independent bitmap test module, S2_dib.dll, creates device-independent bitmaps (DIBs) with random parameters. The test module blits the DIBs to a window. This test module directly exercises the CreateDIBSection function. The test module also exercises the API for palette creation and use, and tests the BitBlt function.
This test module does not require a server.
To run the device-independent bitmap test module, graphic device interface (GDI) must be present in the Windows Embedded CE OS. GDI is present on all display-based operating systems, but is not present on most headless operating systems.
To set the random seed for this test module, you can provide the value of the seed following the s2_dib command.