Runtime Power Focused Stress with Driver Verifier's Concurrency Stress (Logo)

This test performs I/O on different combinations of devices to alternate the devices between Active and Idle condition. Creating different combinations of devices being Active and Idle will help to ensure that the PEP logic is fully exercised.

Test details

Specifications
System.Fundamentals.PowerManagement.CS.CSQuality
Platforms
Windows 8.1 (x86)
Windows 8.1 (x64)
Windows RT 8.1
Windows 10 (x86)
Windows 10 (x64)
Windows 10 (ARM)
Expected run time (in minutes)480
CategoryDevelopment
Timeout (in minutes)480
Requires rebootfalse
Requires special configurationfalse
Typeautomatic

 

Running the test

This is a system-specific implementation of an existing test. For more information on this test, see Round Trip Test (Manual) - Certification.

Troubleshooting

For troubleshooting information, see Troubleshooting System Fundamentals Testing.

More information

Parameters

ParameterDescription

DQ

The SDEL device query.

TestCycles

The number of test cycles.

Default value: 400

DelayBetweenCycles

The delay time in milliseconds between each test cycle.

Default value: 1000

IODuration

The I/O duration in milliseconds.

Default value: 1000

VerifierFalgs

The Driver Verifier flags to enable.

Default value: 0x289BB

TestTimeoutValue

The timeout value for te.exe.

Default value: 7:50:0

OptTeCmdlineParams

The optional command line parameters for te.exe.

 

Command syntax

Command optionDescription

TE.exe /inproc /enablewttlogging /appendwttlogging rtpwrstresscuzz.dll /p:”TestCycles=[TestCycles]” /p:”DelayBetweenCycles=[DelayBetweenCycles]” /p:”IODuration=[IODuration]” /p:”VerifierFlags=[VerifierFlags]” /p:”TestTimeoutValue=[TestTimeoutValue]” /p:”OptTeCmdLineParams=[OptTeCmdLineParams]”

Runs the test.

 

Note  

For command-line help for this test binary, type /h

File list

FileLocation

Rtpwrstresscuzz.dll

[OSBinRoot]\

Te.exe

[TAEFBinRoot]\

 

Parameters

Parameter nameParameter description
DQSDEL Device Query
TestCyclesNumber of test cycles
DelayBetweenCyclesDelay time in milliseconds between each test cycle
IODurationI/O duration in milliseconds
VerifierFlagsDriver Verifier flags to enable
TestTimeoutValueTimeout value for the execution of te.exe
OptTeCmdlineParamsOptional commandline parameters for te.exe

 

 

 

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