Summary View - Profiler Sampling Data

The Summary view displays information about the most performance-expensive functions in a profiling run. From each data point in the Summary view, you can move to more detailed views by right-clicking the function name.

To change the number of functions displayed in the lists, click the Tools menu and then click Options. Click Performance Tools on the options tree. Enter the new number in the Number of functions in Summary view box.

Functions Causing Most Work

Lists the functions that have the greatest number of inclusive samples in the profiling run. An inclusive sample is assigned to a function when the function or one of the functions called by the function is executing. A large number of inclusive samples indicates that significant time was spent in the call tree of the function.

Column

Description

Name

The name of the function.

Samples

The number of samples collected in this function in the profiling run. The number includes samples collected in child functions called by this function.

%

The percentage of all samples in the profiling run that were collected in this function or in a child function called by this function..

Functions With Most Individual Work

Lists the functions that have the greatest number of exclusive samples in the profiling run. An exclusive sample is assigned to a function if the function is executing its own code (and not calling another function) when the sample was collected. A large number of inclusive samples indicates that significant time was spent in the function itself.

Column

Description

Name

The name of the function.

Samples

The number of samples collected in this function in the profiling run. The number does not includes samples that were collected in child functions called by this function.

%

The percentage of all samples in the profiling run that were collected in this function, excluding samples collected in a child functions called by this function.

See Also

Reference

Summary View - Profiler .NET Memory Data

Summary View - Profiler Instrumentation Data