CPUStress Tests (Device Fundamentals)

The CpuStress tests perform device I/O testing with different processor utilization levels.

CpuStress

TestDescription

Device I/O with alternating processor utilization levels

This test does device I/O testing while alternating between high (HPU) and low (LPU) processor utilization levels.

Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc

Test method: Device_IO_With_Varying_ProcUtil

Parameters: - see Device Fundamentals Test Parameters

DQ

PingPongPeriod

HPU

LPU

TestCycles

Device I/O with a fixed processor utilization level

This test does device I/O testing with the processor utilization (PU) level set to a fixed percentage.

Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc

Test method: Device_IO_With_Fixed_ProcUtil

Parameters: - see Device Fundamentals Test Parameters

DQ

IOPeriod

PU

Device PNP with a fixed processor utilization level

This test does device PNP testing with the processor utilization (PU) level set to a fixed percentage.

Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc

Test method: Device_PNP_With_Fixed_ProcUtil

Parameters: - see Device Fundamentals Test Parameters

DQ

TestCycles

PU

Sleep with fixed processor utilization

This test cycles the system through various sleep states with the processor utilization level set to a fixed percentage.

Test binary: Devfund_ProcUtil_PingPong_With_IO.wsc

Test method: Sleep_With_Fixed_ProcUtil

Parameters: - see Device Fundamentals Test Parameters

TestCycles

PU

 

Related topics

How to How to test a driver at runtime using Visual Studio
How to select and configure the Device Fundamentals tests
Device Fundamentals Tests
Device Fundamentals Test Parameters
Provided WDTF Simple I/O plug-ins
How to test a driver at runtime from a Command Prompt

 

 

Send comments about this topic to Microsoft

Show:
© 2014 Microsoft