Export (0) Print
Expand All

I/O Tests (Device Fundamentals)

The Device Fundamentals I/O tests perform basic I/O testing on the specified devices.

I/O tests

TestDescription

Device I/O

This test performs basic I/O testing on devices.

Test binary: Devfund_Device_IO.wsc

Test method: DeviceIO

Parameters: - see Device Fundamentals Test Parameters

DQ

TestCycles

IOPeriod

IOType

Simple I/O stress test with I/O process termination

This test performs simple I/O testing on devices in a separate process and terminates the I/O process after the specified I/O period and test cycles.

Test binary: Devfund_SimpleIoStress_TermIoProc.wsc

Test method: SimpleIOStress_TermIoProc

Parameters: - see Device Fundamentals Test Parameters

DQ

TestCycles

IOPeriod

 

Related topics

How to How to test a driver at runtime using Visual Studio
How to select and configure the Device Fundamentals tests
Device Fundamentals Tests
Device Fundamentals Test Parameters
Provided WDTF Simple I/O plug-ins
How to test a driver at runtime from a Command Prompt

 

 

Send comments about this topic to Microsoft

Show:
© 2014 Microsoft