USB Device Logo Testing Recommended Practices

  • Article

Generic USB Tests: Microsoft

  • USB Address Description Test
  • USB Device Control Requests Test
  • USB Enumeration Stress Test
  • USB Descriptor Test
  • USB Selective Suspend
  • USB Serial Number

Generic USB Tests: USB interface (IF) and Intel

  • Command Verifier (CV) Test Suite:****

    • USB Device Framework (CV) Test
    • USB HIDView (CV) Test

  • USB Specification Compliance

Connecting a device to a USB 2.0 hub

  • Advantages with this method:****

    • Recommended for regular USB devices
    • Required for the USB Selective Suspend test
    • Forces low and full-speed devices to be enumerated by the EHCI (high speed) controller

  • Disadvantages with this method:

    • Devices with embedded hubs must be directly connected for Microsoft tests
    • Multi-TT hubs not recommended for logo testing

Devices with embedded hubs

  • For embedded full-speed hubs:****

    • Use an external USB 2.0 hub for the USB Device Framework (CV) Test and USB HIDView (CV) Test
    • Attach the device directly to the system for all other tests

  • For embedded high-speed hubs

    • Attach the device directly to the system for all tests

  • Note: Exposed ports****

    • If the hub exposes ports, the embedded hub must separately pass the USB Hub logo program

    • Embedded full-speed hubs are exempt from the USB Hub Basic Transfer Test

    • Change the IsEmbeddedUSBDevice parameter from FALSE to TRUE for the following tests:

      • USB HIDView (CV) Test
      • USB Address Description Test
      • USB Descriptor Test
      • USB Device Control Requests Test
      • USB Device Framework (CV) Test
      • USB Enumeration Stress Test
      • USB Hub Compliance (CV) Test
      • USB Selective Suspend
      • USB Serial Number

Systems with embedded devices

  • For embedded devices that are not attached via a USB hub:****

    • The USB Selective Suspend test will always fail
    • The USB Device Framework (CV) Test and the USB HIDView (CV) Test will fail unless the embedded device is a high-speed (USB 2.0) device

  • For embedded devices that are attached downstream of 2 or more hubs:

    • All Microsoft-supplied tests will fail. The USB Device Framework (CV) Test and the USB HIDView (CV) Test will fail unless the device is a high-speed device

  • Solution:

    • Set the IsEmbeddedUSBDevice job parameter to TRUE if and only if your device falls into one of the above categories
    • The IsEmbeddedUSBDevice job parameter is used in the following tests:
      • USB HIDView (CV) Test
      • USB Address Description Test
      • USB Descriptor Test
      • USB Device Control Requests Test
      • USB Device Framework (CV) Test
      • USB Enumeration Stress Test
      • USB Hub Compliance (CV) Test
      • USB Selective Suspend
      • USB Serial Number

For the USB Basic Transfer Test

  • The USB Hub Basic Transfer Test is designed only to evaluate USB 2.0 high-speed hubs (400 Mbps), not full-speed or USB 1.1 hubs (11 Mbps). For full-speed hubs, customer should set the IsEmbeddedFullSpeedHub schedule-time parameter to TRUE in the Device Console when scheduling this test. The parameter lets DTM know that the hub is not a high-speed hub and will therefore exempt the test entirely.

USB Serial Number test

  • The USB Serial Number test runs only if device supports unique serial number
  • The test validates the uniqueness of the serial number
  • The test requires two identical devices to run
  • The devices must be attached before the test is scheduled to run

For the USB Device framework test, the USB HIDView test and the USB Hub compliance test

  • If the test machine has two USB controllers disable the controller that is not under test or the test will fail

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Built on December 10, 2009